Maximum ratings are the extreme limits to which the chip can be exposed for a limited amount of time without permanently damaging it. Exposure to absolute maximum ratings for prolonged periods of time may affect the reliability of the device.
For accelerated lifetime testing (HTOL, etc.), supply voltage should not exceed the recommended operating conditions max value, see Recommended operating conditions.
Table 1. Supply voltage
| |
Min. |
Max. |
Unit |
| VDD |
-0.3 |
3.9 |
V |
| VDDH |
-0.3 |
5.8 |
V |
| VBUS |
-0.3 |
5.8 |
V |
| VSS |
-0.3 |
0 |
V |
Table 2. I/O pin voltage
| |
Min. |
Max. |
Unit |
| VI/O, VDD ≤ 3.6 V |
-0.3 |
VDD + 0.3 |
V |
| VI/O, VDD > 3.6 V |
-0.3 |
3.9 |
V |
Table 3. NFC antenna pin current
| |
Min. |
Max. |
Unit |
| INFC1/2 |
|
80 |
mA |
Table 4. Radio
| |
Min. |
Max. |
Unit |
| RF input level |
|
10 |
dBm |
Table 5. Environmental aQFN™ package
| |
Min. |
Max. |
Unit |
| Storage temperature |
-40 |
+125 |
°C |
| Moisture Sensitivity Level (MSL) |
|
2 |
|
| ESD Human Body Model (HBM) |
|
2
Pins DECR and DECN are 1.4
|
kV |
| ESD Charged Device Model (CDM) |
|
500 |
V |
Table 6. Environmental WLCSP package
| |
Min. |
Max. |
Unit |
| Storage temperature |
-40 |
+125 |
°C |
| Moisture Sensitivity Level (MSL) |
|
1 |
|
| ESD Human Body Model (HBM) |
|
2
Pins DECR and DECN are 1.4
|
kV |
| ESD Charged Device Model (CDM) |
|
500 |
V |
Table 7. Flash memory
| |
Min. |
Max. |
Unit |
| Endurance |
10,000 write/erase cycles |
|
|
| Retention |
10 years at 40°C |
|
|
