Maximum ratings are the extreme limits to which the chip can be exposed for a limited amount of time without permanently damaging it. Exposure to absolute maximum ratings for prolonged periods of time may affect the reliability of the device1.
Min. | Max. | Unit | |
---|---|---|---|
Supply voltages | |||
VDD | -0.3 | +3.9 | V |
VDDH | -0.3 | +5.8 | V |
VBUS | -0.3 | +5.8 | V |
VSS | 0 | V | |
I/O pin voltage | |||
VI/O, VDD ≤ 3.6 V | -0.3 | VDD + 0.3 | V |
VI/O, VDD > 3.6 V | -0.3 | 3.9 | V |
NFC antenna pin current | |||
INFC1/2 | 80 | mA | |
Radio | |||
RF input level | 10 | dBm | |
Environmental aQFN™ package | |||
Storage temperature | -40 | +125 | °C |
Moisture Sensitivity Level (MSL) | 2 | ||
ESD Human Body Model (HBM) | 2 |
kV | |
ESD Charged Device Model (CDM) | 500 | V | |
Environmental WLCSP package | |||
Storage temperature | -40 | +125 | °C |
Moisture Sensitivity Level (MSL) | 1 | ||
ESD Human Body Model (HBM) | 2 |
kV | |
ESD Charged Device Model (CDM) | 500 | V | |
Flash memory | |||
Endurance | 10 000 write/erase cycles | ||
Retention | 10 years at 40°C |