Absolute maximum ratings

Maximum ratings are the extreme limits to which the chip can be exposed for a limited amount of time without permanently damaging it. Exposure to absolute maximum ratings for prolonged periods of time may affect the reliability of the device1.

Table 1. Absolute maximum ratings
  Min. Max. Unit
Supply voltages
VDD -0.3 +3.9 V
VDDH -0.3 +5.8 V
VBUS -0.3 +5.8 V
VSS   0 V
I/O pin voltage
VI/O, VDD ≤ 3.6 V -0.3 VDD + 0.3 V
VI/O, VDD > 3.6 V -0.3 3.9 V
NFC antenna pin current
INFC1/2   80 mA
Radio
RF input level   10 dBm
Environmental aQFN™ package
Storage temperature -40 +125 °C
Moisture Sensitivity Level (MSL)   2  
ESD Human Body Model (HBM)  

2
(all pins except DECR and DECN, rated at 1.4 kV)

kV
ESD Charged Device Model (CDM)   500 V
Environmental WLCSP package
Storage temperature -40 +125 °C
Moisture Sensitivity Level (MSL)   1  
ESD Human Body Model (HBM)  

2
(all pins except DECR and DECN, rated at 1.4 kV)

kV
ESD Charged Device Model (CDM)   500 V
Flash memory
Endurance 10 000 write/erase cycles    
Retention 10 years at 40°C    


1 For accelerated life time testing (HTOL, etc) supply voltage should not exceed the recommended operating conditions max value, see Recommended operating conditions.

This document was last updated on
2021-09-27.
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