[212] SAADC: Events are not generated when switching from scan mode to no-scan mode with burst enabled

Any of the following:

• Switching from multiple channels to single channel when BURST is disabled and acquisition time < 10 μs.
• Switching from multiple channels to single channel when BURST is enabled.

Execute the following code before changing the channel configuration:

 
volatile uint32_t temp1;
volatile uint32_t temp2;
volatile uint32_t temp3;

temp1 = *(volatile uint32_t *)0x40007640ul;
temp2 = *(volatile uint32_t *)0x40007644ul;
temp3 = *(volatile uint32_t *)0x40007648ul;

*(volatile uint32_t *)0x40007FFCul = 0ul; 
*(volatile uint32_t *)0x40007FFCul; 
*(volatile uint32_t *)0x40007FFCul = 1ul;

*(volatile uint32_t *)0x40007640ul = temp1;
*(volatile uint32_t *)0x40007644ul = temp2;
*(volatile uint32_t *)0x40007648ul = temp3;

After the workaround is executed, the SAADC configuration is reset. Before use all registers must be configured again.